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Academic Journal

Q2

IET Science, Measurement and Technology

John Wiley & Sons Inc.

United KingdomAtomic and Molecular Physics, and Optics (Q2); Electrical and Electronic Engineering (Q2)ISSN-matched source record
Submission information ↗
Q2Ranking
—Impact Factor (year unverified)
62H-index (SCImago 2025)
0.429SJR (2025)
2007-2026Coverage

About IET Science, Measurement and Technology

IET Science, Measurement and Technology is a scholarly journal published by John Wiley & Sons Inc.. SCImago 2025 lists it in Q2, with an SJR of 0.429 and H-index of 62.

Coverage: 2007-2026. Research categories: Atomic and Molecular Physics, and Optics (Q2); Electrical and Electronic Engineering (Q2).

Open-access policies and author information

Reported in the official DOAJ public CSV snapshot (2026-09-01), downloaded 2026-10-03. Record updated 2026-03-17. This snapshot does not establish today’s listing status or fee quotation.

Accepted manuscript languagesEnglish
Licence optionsCC BY, CC BY-ND, CC BY-NC, CC BY-NC-ND
Peer-review processAnonymous peer review
APCDOAJ-reported APC: 2600 USD; 2000 GBP; 2360 EUR
Waiver policy reportedYes
Other fees reportedNo
Author retains unrestricted copyrightNo
Digital preservationCLOCKSS, Portico
Reported submission-to-publication time39 weeks on average; not a guarantee
Openly licensed content since2021 (not the journal founding year)

Publisher policy links recorded by DOAJ

Source: DOAJ journal record. Journal metadata is distributed by DOAJ under CC0. Confirm current fees, tax, eligibility and waiver terms with the publisher.

Source-backed journal facts

ISSN(s)1751-8822, 1751-8830
ISSN-L1751-8822
Source typeJournal
Publisher / hosting organisationInstitution of Engineering and Technology
Publisher country codeGB
Fully open access (OpenAlex)Yes
DOAJ flag (OpenAlex)Listed in OpenAlex metadata; confirm current status in DOAJ
Works recorded in OpenAlex1,787
Citations recorded in OpenAlex22,475
OpenAlex H-index55
Years represented in OpenAlex2007–2026 (not the founding or closing dates)

Topics in published research

High voltage insulation and dielectric phenomena; Power Transformer Diagnostics and Insulation; Lightning and Electromagnetic Phenomena; Magnetic Properties and Applications; Non-Destructive Testing Techniques; Electromagnetic Compatibility and Noise Suppression.

OpenAlex classifies topics from published works. These topics are not the publisher’s official aims and scope.

Source: OpenAlex source record. Retrieved 2026-10-03. Source record updated 2026-10-02. OpenAlex metrics are different from SCImago metrics and the Clarivate Journal Impact Factor.

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