Academic Journal
Q2IEEE Transactions on Nuclear Science
About IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science is a scholarly journal published by Institute of Electrical and Electronics Engineers Inc.. SCImago 2025 places it in Q2 with an SJR of 0.589 and an H-index of 144.
Its listed coverage is 1963-2026 and its research categories include Electrical and Electronic Engineering (Q2); Nuclear and High Energy Physics (Q2); Nuclear Energy and Engineering (Q2). The 2025 dataset reports 483 documents and 2327 citations across the latest three-year reporting window.
Journal Metrics
Metrics can change by reporting year. Verify time-sensitive values with the publisher or indexing service.
Aims & Scope
The journal publishes research related to Radiation Detection and Scintillator Technologies, Nuclear Physics and Applications, Radiation Effects in Electronics, Particle Detector Development and Performance, Particle accelerators and beam dynamics, Semiconductor materials and devices.
Recent Research Articles
Latest publications matched automatically by ISSN.
Total Ionizing Dose Hardening of Embedded Void Silicon-on-Insulator MOSFET by Integrating Back-Gate Modulation
Tianxiang Zhao, Qiang Liu, Jin Chen, Yuxin Liu et al.
2026-09 · DOI: 10.1109/tns.2026.3721439Temperature and Gate Bias Induced Recovery Effect for SiC MOSFETs After Total Ionizing Dose Effect
Zhaoxu Song, Yu Tian, Zheyuan Zhang, Suyu Xu et al.
2026-09 · DOI: 10.1109/tns.2026.3723135Research on Multiparameter Self-Tuning of Digital Low-Level RF System Based on Reinforcement Learning
Kai Guo, ZheXin Xie, ZhenCheng Mu, HeXin Wang et al.
2026-09 · DOI: 10.1109/tns.2026.3713298Neutron/X-Ray Dual-Modality Tomography at ERNI: A Case Study on Cultured Pearls
Xin Shu, Shengxiang Wang, Xin Ge, Jiancong Li et al.
2026-09 · DOI: 10.1109/tns.2025.3640240Charge Collection Efficiency in a Novel Graphene-Optimized Silicon Carbide Detector Under 160 keV X-Ray Irradiation
Yingjie Huang, Congcong Wang, Jingxuan He, Yi Zhan et al.
2026-09 · DOI: 10.1109/tns.2026.3727278Unsupervised Prior-Guided Implicit Neural Representation for Iterative Reconstruction in Neutron Coded Aperture Imaging
Xubin Zhang, Mingfei Yan, Lucheng Yang, Jingru Chen et al.
2026-09 · DOI: 10.1109/tns.2026.3723396Non-Contact Single Event Effect Detection Method Based on Noise2Self-KNN
Yifan Du, Xiang Zhu, Yingqi Ma, Jianwei Han et al.
2026-09 · DOI: 10.1109/tns.2026.3708343Time Resolution of a 4H-SiC PIN Detector Irradiated With 16 MeV/u Ta Ions
Jingxuan He, Congcong Wang, Yi Zhan, Zhenyu Jiang et al.
2026-09 · DOI: 10.1109/tns.2026.3715517Imagine a Community Hopeful for the Future: IEEE Foundation
2026-08 · DOI: 10.1109/tns.2026.3721716Large-Batch Testing Methodology for Compliance to Low Destructive SEE Cross-Sections in Accelerator Control Systems
Rudy Ferraro, Alessandro Zimmaro, Antonio Scialdone, Gilles Foucard et al.
2026-08 · DOI: 10.1109/tns.2026.3692062Stochastic Framework for Extracting Worst Case Test Vectors in ASICs Under Single-Event Effects
Mostafa M. Abdelrazik, Mostafa A. Hemeda, Ahmed I. Mohamed, Rawan A. Elomda et al.
2026-08 · DOI: 10.1109/tns.2026.3701522Self-Healing Architecture for RISC-V Soft Core Processor in SRAM-Based FPGAs Using Dynamic Partial Reconfiguration
Jorge Cano-Paez, Luis Entrena, Mario Garcia-Valderas, Almudena Lindoso et al.
2026-08 · DOI: 10.1109/tns.2026.3678753TID Effects in Si and SiC Power MOSFETs and Their Implications on the Performances of a Buck DC/DC Converter
Hadrien Couillaud, Noe Fourmont, Christophe Delbos, Giles Assaillit et al.
2026-08 · DOI: 10.1109/tns.2026.3660211RISC-V Proton Reliability Assessment Using Redundancy and Optimization Techniques on Bare Metal and Linux
Sergio Cuenca-Asensi, Enrique Abma-Romero, Maxim IJzelendoorn, Pedro Martinez-Olgado et al.
2026-08 · DOI: 10.1109/tns.2026.3684010A Radiation-Hardened Ramp ADC With Self-Calibrating Slope for High-Dose Applications
Pengxu Li, Xin Geng, Shuangyuan Wang, Zhiyong Ye et al.
2026-08 · DOI: 10.1109/tns.2026.3710340Comments by the Editors
Dan Fleetwood, Heather Quinn, Steven Moss, Vincent Goiffon et al.
2026-08 · DOI: 10.1109/tns.2026.3716319Toward Accurate Monitoring of 14 MeV Neutron Flux: Investigating a 6 Lithium Glass Scintillator
F. Fricano, L. Weninger, A. Morana, A. Colangeli et al.
2026-08 · DOI: 10.1109/tns.2026.3672761Front Cover
2026-08 · DOI: 10.1109/tns.2026.3716165Synergistic Radiation Effect of 300 MeV Proton and Heavy Ion on Electrical Characteristics of β -Ga 2 O 3 SBD
Zhengliang Zhang, Jianli Liu, Yiping Xiao, Chaoming Liu et al.
2026-08 · DOI: 10.1109/tns.2026.3666502Quasi Event-Wise Measurement and Simulation of Neutron-Induced Multiple-Cell Upsets in 22- and 55-nm SRAMs
Yuibi Gomi, Kazusa Takami, Ryuichi Yasuda, Hiroki Kanda et al.
2026-08 · DOI: 10.1109/tns.2026.3675003Reviews
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September 8, 2026 at 12:03 am
September 8, 2026