Edge illumination dark field signal generated by flour
This data set contains the results of an experiment described in "Efficient X-ray dark field contrast simulations using a condensed history approach". The sample was a 3D printed container with four holes of various shapes. The holes were filled with flour, a fine-grained powder that causes small
This data set contains the results of an experiment described in “Efficient X-ray dark field contrast simulations using a condensed history approach”. The sample was a 3D printed container with four holes of various shapes. The holes were filled with flour, a fine-grained powder that causes small-angle X-ray scattering, measurable as dark field using the edge illumination X-ray phase contrast setup.
Acquisition scheme:
- dark current image to correct for detector noise
- flat field projections
- 21 mask steps of 5 micrometer to sample the IC in each pixel
- sample projections
- 21 mask steps of 5 micrometer to sample the IC in each pixel
Postprocessing, i.e. gaussian fitting of the IC curves, was performed using the open source gpufit software (https://github.com/gpufit/Gpufit).
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Files are hosted on the source repository. Click download to access the full dataset.