Electron Microscopy and GIWAXS Raw Data and Code

This dataset includes electron microscopy and GIWAXS raw data and code generated within the scope of our paper: 3D electron diffraction—the missing slice completing nanoscale analysis of organic solar cells in TEM. Nat Commun 17, 3159 (2026). https://doi.org/10.1038/s41467-026-70690-y

The provided datasets and code are arranged measurement wise in zip files and contain README files with basic descriptions and evaluation procedures to facilitate accessability.

The content of the respective zip files is listed in the following:

• scripts 3D ED workflow: Digital Micrograph (GMS) scripts for evaluation of 3D electron diffraction (3D ED) data
• STEM-EELS DRCN5T: STEM-EELS measurement of a solvent vapor annealed (SVA,700s, CS2) DRCN5T:PC71BM film
• STEM: STEM data of SVA DRCN5T:PC71BM sample and two P3HT:PC71BM samples, one untreated (WO), the other one thermally annealed (10 min, 150°C)
• GIWAXS: lab-based and synchrotron based measurements of the SVA DRCN5T:PC71BM sample with respective evaluation instruction
• EFTEM P3HT: EFTEM image around 30eV electron loss energy of the two P3HT:PC71BM samples (WO, TA 10min)
• ED patterns: Electron diffraction patterns of the respective tilt series of 3D ED of the three organic samples (P3HT:PC71BM WO and TA 10min, DRCN5T:PC71BM SVA)
• 4D-SCED files: 4D-SCED datasets of the respective three organic samples (P3HT:PC71BM WO and TA 10min, DRCN5T:PC71BM SVA) (for details on evaluation see our publication)