Academic Journal
Quartile not availableDigest of Technical Papers – Symposium on VLSI Technology
About Digest of Technical Papers – Symposium on VLSI Technology
Digest of Technical Papers – Symposium on VLSI Technology: a proceedings record, not a conventional journal
The title recorded here, Digest of Technical Papers – Symposium on VLSI Technology, is the long-running proceedings serial of the Symposium on VLSI Technology, one of the two historic meetings that now form the IEEE Symposium on VLSI Technology and Circuits. It is not a monthly or quarterly journal with rolling submissions, an editor-in-chief handling manuscripts throughout the year, and issues assembled from accepted articles. It is an annual conference digest: a bounded volume, tied to a specific meeting in a specific year and place, containing the short technical papers presented at that meeting after competitive peer review. Understanding that distinction explains almost everything else about the record — its two ISSNs, its citation pattern, its publisher, and the way a researcher should use it. The Journals World record lists the publisher as Institute of Electrical and Electronics Engineers Inc. in the United States, the subject focus as Engineering, ISSNs 2158-9682 and 0743-1562, an h-index of 88, and an SJR value of 1.276 in the underlying SCImago-derived data. Those identifiers belong to the digest as a serial publication, catalogued year after year, even though each annual volume is first and foremost the archival record of a live technical meeting where device engineers reported what they had actually fabricated and measured.
For a newcomer to microelectronics, the name itself needs unpacking. VLSI stands for very-large-scale integration, the technology of integrating very large numbers of transistors on a single chip. The symposium concerns the technology side of that enterprise: transistor structures, materials, fabrication processes, interconnects, memory devices, and the physical foundations on which circuits are built. Its sibling meeting, the Symposium on VLSI Circuits, founded later, concerns circuit and system implementations built with those technologies. Since 2022 the two symposia have been merged in presentation as a single Symposium on VLSI Technology and Circuits, precisely because modern progress rarely respects the old boundary — a new transistor is interesting in part for the circuits it enables, and a new circuit technique is credible in part because of the process in which it can be manufactured. The digest title in this record, however, preserves the older, technology-specific name under which decades of volumes were published and indexed, and it is under that name that libraries, IEEE Xplore, Scopus, and SCImago have accumulated the citation history summarised by the h-index and SJR figures above.
Quick facts
| Record title | Digest of Technical Papers – Symposium on VLSI Technology |
|---|---|
| Publication type | Annual conference proceedings serial (digest of an IEEE symposium) |
| Publisher in record | Institute of Electrical and Electronics Engineers Inc., United States |
| ISSN in record | 2158-9682; 0743-1562 |
| Subject focus in record | Engineering, with emphasis on electrical and electronic engineering and semiconductor devices |
| Metrics in record | h-index 88; SJR 1.276 |
| Meeting origin | Symposium on VLSI Technology first organised in 1981; VLSI Circuits symposium added in 1987; merged presentation since 2022 |
| Sponsors | IEEE Electron Devices Society and IEEE Solid-State Circuits Society, with the Japan Society of Applied Physics, in cooperation with the Institute of Electronics, Information and Communication Engineers |
| Current meeting form | IEEE Symposium on VLSI Technology and Circuits, held in person with on-demand access to technical sessions in recent editions, alternating historically between sites in the United States and Japan, notably Honolulu and Kyoto |
History: an open forum founded at the start of the VLSI era
The symposium's own historical account credits Professors Shoji Tanaka and Walter Kosonocky with organising the first VLSI Technology Symposium in 1981, to give leading technologists an open setting in which to exchange ideas at a moment when integration was rapidly becoming a revolution in industrial capability. That founding date matters for reading the digest. A 1981 volume belongs to a world in which CMOS scaling, silicided contacts, and megabit memories were live research frontiers rather than textbook history. The symposium's Test of Time discussion of a paper from that very first meeting, on a transmission-line model for silicided diffusions, illustrates the point concretely: work first reported in a two-page digest paper helped motivate silicide-clad diffusions that supported transistor scaling for decades. Digest papers are short, but short has never meant minor in this community; the format rewards a single, well-evidenced advance reported promptly to the peers best placed to test, adopt, or refute it.
Through the following decades the meeting alternated between sites in the United States and Japan, reflecting the geography of the semiconductor industry it served, and in 1987 the first Symposium on VLSI Circuits was held alongside it to provide the same focused forum for circuit and system implementations. For more than thirty years the two meetings remained linked, with overlapping programmes, joint sessions in later years, and opportunities deliberately created for technology specialists and circuit designers to attend each other's presentations. In 2022 they were merged into one symposium to maximise the synergy across both domains, a change announced in the calls for papers for the combined meeting. The 2024 edition, for example, was a five-day in-person meeting in Honolulu built around the theme of bridging digital and physical worlds with efficiency and intelligence, with on-demand access following the live sessions. A reader tracing the digest title across those years should therefore expect a title evolution in catalogues: older volumes under the technology symposium's own name, newer material under the combined technology and circuits branding, and indexing services that do not always draw the boundary in exactly the same place or year. That is a cataloguing feature of a long-lived proceedings serial, not evidence of two different research communities.
Scope: what a technology digest paper actually covers
The combined symposium's recent calls for papers define the modern scope, and the technology half of that scope is the direct continuation of the digest recorded here. Headline areas include advanced CMOS platforms, interconnect and backside power delivery network technologies; advanced packaging, chiplet and heterogeneous integration technologies including 2.5D and 3D approaches; beyond-CMOS devices that use new physics, including spin, optical and quantum approaches; device physics, characterisation, modelling and reliability; and the technology foundations for applications such as artificial intelligence and machine learning hardware, Internet of Things devices, wearable and implantable biomedical systems, big data and cloud or edge computing, virtual and augmented reality, robotics, and autonomous vehicles. Analogue and mixed-signal circuits, data converters, and other circuit topics sit principally on the circuits side of the combined meeting, and a careful reader should not attribute every topic in a combined call for papers to the historic technology digest alone.
Three features distinguish a strong technology paper in this venue. First, experimental grounding: the community's norm is silicon evidence — fabricated devices, measured characteristics, and comparisons at matched conditions — rather than simulation alone, although modelling and characterisation papers form a recognised part of the programme. Second, scaling relevance: a result is usually positioned against the trajectory of the field, whether that is transistor density, energy per operation, memory density and bandwidth, interconnect resistance, or reliability margins, so readers can judge whether an advance survives contact with manufacturing constraints. Third, candour about limits: variation, yield, thermal budgets, materials compatibility, and integration costs are not footnotes here; they are often the reason a laboratory result does or does not become a technology. Authors preparing work for this community, and readers appraising it afterwards, should apply those three tests before any citation count.
How the programme is built: review, presentation, and the digest
Submission follows an annual call for papers with a single main deadline, supplemented in the technology tradition by a late-news route for exceptionally timely results; the exact dates, page limits, and templates for a given year are set in that year's call and must be checked there rather than assumed from a previous edition. Papers are peer reviewed by the programme committee and its reviewers for originality, technical quality, and significance to the symposium audience, and accepted papers are presented at the meeting and published in the digest distributed through IEEE channels, principally IEEE Xplore. The meeting format around the technical sessions is part of the scientific instrument: demonstration sessions, evening panel discussions, joint focus sessions, short courses, and workshops are all documented features of recent editions, alongside mentoring events for women in engineering and young professionals sponsored by the two IEEE societies. In other words, the digest is the permanent residue of a week designed for argument, comparison, and rapid feedback among specialists who will themselves attempt to reproduce or surpass the reported results.
That origin has consequences for citation practice. A digest paper typically reports an advance at the moment of first convincing demonstration, often before a fuller journal treatment exists, and sometimes as the only archival treatment if the team moves on to the next technology node. Later journal articles in venues such as IEEE Transactions on Electron Devices may extend the same work with fuller methodology and analysis. Neither version automatically supersedes the other for every purpose: cite the digest for priority and for the result as presented to the community, and the journal version, when it exists, for the most complete technical account. Checking both, and checking whether a digest paper was later corrected or substantially revised in journal form, is ordinary scholarly diligence in this field, not pedantry.
Metrics and indexing, read correctly
The record's h-index of 88 means, in the SCImago construction, that 88 publications in the serial have each attracted at least 88 citations in the underlying Scopus data — a substantial figure for a proceedings serial whose individual papers are short and whose field also publishes heavily in journals and in the larger IEEE International Electron Devices Meeting. The SJR value of 1.276 in the record weights citations by the prestige of the citing sources and, being above 1, indicates above-average citation prestige for the window from which the value was drawn. Both figures move between SCImago releases as the citation window and coverage change, and different aggregators report different values for different years; the figures in this profile are the values carried in the Journals World record, stated as such, and should be quoted with their source and year rather than treated as permanent properties of the symposium.
Two cautions are specific to proceedings. First, a proceedings serial can accumulate citations unevenly: a handful of landmark device papers may account for a disproportionate share, so the serial-level h-index says little about the likely citation fate of any individual new paper. Second, title and coverage splits matter. The technology digest, the circuits digest, and the later combined symposium are related but distinct cataloguing entities; a metric retrieved for one title should not be pasted onto another, and coverage histories in indexing services show gaps and changes that reflect cataloguing decisions as much as scientific activity. Indexing in Scopus and dissemination through IEEE Xplore make the digest discoverable and citable worldwide, but discoverability is not a quality certificate for any single paper; the review history, the silicon evidence, and the subsequent literature remain the real tests.
Who should submit, who should read, and what alternatives to consider
The natural authors are research teams in industry laboratories, universities, and research institutes with a fabricated, measured, or rigorously modelled advance in semiconductor technology that is ready for scrutiny by the most demanding peer audience in the field, and who can state its significance compactly. Industrial authorship has always been prominent at this symposium, which is one of its strengths: papers often come from teams close to manufacturing, with access to processes and test structures that university laboratories cannot replicate. The natural readers are device and process engineers, circuit designers tracking what future processes will offer, technology managers making roadmap decisions, and researchers in adjacent venues who need to know what has actually been demonstrated rather than merely proposed.
Fit should be judged honestly against neighbouring venues. The IEEE International Electron Devices Meeting is the larger, broader device meeting; the International Solid-State Circuits Conference leads on circuits; the technology and circuits symposium occupies the deliberately smaller, mid-year, interaction-intensive position its founders designed, with the unique advantage that technology and circuits audiences are in the same rooms. A purely circuit contribution belongs on the circuits side of the combined meeting or at a circuits venue; a purely theoretical contribution without a path to fabrication may fit a journal better; a mature, extensive study may deserve the fuller format of a transactions journal from the outset, with a digest presentation, if the work qualifies, used to establish priority and gather community response. Registration fees, article processing terms for any open-access option, and copyright arrangements are set per edition and per IEEE policy for that year; they are not published as a single permanent tariff in the sources consulted for this profile, so authors should confirm them in the current call for papers and the IEEE author instructions rather than relying on secondary summaries.
Practical guidance for using this record
When you cite or evaluate a paper from this digest, record the year and the meeting edition alongside the title, because the serial title alone spans more than four decades of volumes. Verify the ISSN pair 2158-9682 and 0743-1562 against the specific volume you used when a library or funder requires it, since print and electronic identifiers are assigned to the serial in different catalogues in different orders. Distinguish the technology digest from the circuits digest in bibliographies; conflating them misattributes both papers and metrics. If a claim in a digest paper is load-bearing for your own work — a record mobility, a reliability lifetime, an energy figure — trace whether the same team published an extended account, whether independent groups reproduced the result, and whether later symposium editions reported the same technology at a more advanced node. Finally, treat any website that promises a simple impact factor, a guaranteed acceptance, or a shortcut into the programme with suspicion: the symposium publishes its calls, deadlines, and programme through its official site and IEEE, and no third party can confer its peer review.
Reading a digest paper critically
A digest paper compresses motivation, fabrication, measurement, and interpretation into a few pages, so a critical reader must reconstruct what compression removed. Check the device dimensions, bias conditions, temperature, sample size, and statistical treatment behind any headline figure; a record value measured on a single hero device carries different weight from a median across a wafer. Check what comparison technology was used and whether it was fabricated and measured under the same conditions or quoted from another group's publication. Check whether reliability, variability, and integration constraints are reported alongside performance, because a technology that wins on one axis while silently surrendering another rarely survives adoption. Those questions, applied consistently, turn the digest from a catalogue of claims into the working record of a field negotiating, year by year, what scaling will do next.
Frequently asked questions
Is this a journal? No. It is the proceedings digest of an annual IEEE symposium, catalogued as a serial with ISSNs 2158-9682 and 0743-1562, which is why bibliographic databases list it alongside journals and why SCImago computes serial-level metrics for it.
Who publishes and sponsors it? The publisher of record is the Institute of Electrical and Electronics Engineers Inc. The symposia are sponsored by the IEEE Electron Devices Society and the IEEE Solid-State Circuits Society with the Japan Society of Applied Physics, in cooperation with the Institute of Electronics, Information and Communication Engineers, as stated in the symposium's own history.
When did it begin? The Symposium on VLSI Technology was first organised in 1981 by Professors Shoji Tanaka and Walter Kosonocky. The VLSI Circuits symposium was added in 1987, and the two have been presented as a merged Symposium on VLSI Technology and Circuits since 2022.
What are its metrics in this record? h-index 88 and SJR 1.276, as carried in the Journals World record from SCImago-derived data. Values differ by year and aggregator; quote them with source and date.
How do I submit? Through the annual call for papers on the official symposium site, observing that year's deadline, format, and review process. Fees and open-access terms for a given edition are confirmed in that call and in IEEE author guidance; no permanent figure is stated here because none is published as a standing tariff in the sources consulted.
Where are papers read after the meeting? Through IEEE Xplore and library holdings of the annual digest, with indexing reflected in Scopus-derived services. Always cite the specific year and edition.
Journal Metrics
A quartile may vary by subject category. Values without a source or reporting year are unverified historical entries. Verify the current Journal Impact Factor with Clarivate or the publisher before using it.
Aims & Scope
The publisher’s official aims and scope have not yet been verified for this profile. Use the journal website to check subject fit and accepted article types before submitting.
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Version History
October 16, 2026 at 7:47 am
October 10, 2026