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Academic Journal

Q2

IEEE Open Journal of Instrumentation and Measurement

Institute of Electrical and Electronics Engineers

United StatesElectrical and Electronic Engineering (Q2); Instrumentation (Q2)ISSN-matched source record
Submission information ↗
Q2Ranking
—Impact Factor (year unverified)
11H-index (SCImago 2025)
0.438SJR (2025)
2022-2026Coverage

About IEEE Open Journal of Instrumentation and Measurement

IEEE Open Journal of Instrumentation and Measurement is a scholarly journal published by Institute of Electrical and Electronics Engineers. SCImago 2025 lists it in Q2, with an SJR of 0.438 and H-index of 11.

Coverage: 2022-2026. Research categories: Electrical and Electronic Engineering (Q2); Instrumentation (Q2).

Open-access policies and author information

Reported in the official DOAJ public CSV snapshot (2026-09-01), downloaded 2026-10-03. Record updated 2026-03-12. This snapshot does not establish today’s listing status or fee quotation.

Accepted manuscript languagesEnglish
Licence optionsCC BY, CC BY-NC-ND
Peer-review processAnonymous peer review
APCDOAJ-reported APC: 2160 USD
Waiver policy reportedYes
Other fees reportedNo
Author retains unrestricted copyrightYes
Digital preservationPortico
Reported submission-to-publication time7 weeks on average; not a guarantee
Openly licensed content since2022 (not the journal founding year)

Publisher policy links recorded by DOAJ

Source: DOAJ journal record. Journal metadata is distributed by DOAJ under CC0. Confirm current fees, tax, eligibility and waiver terms with the publisher.

Source-backed journal facts

ISSN(s)2768-7236
ISSN-L2768-7236
Source typeJournal
Publisher / hosting organisationInstitute of Electrical and Electronics Engineers
Publisher country codeUS
Fully open access (OpenAlex)Yes
DOAJ flag (OpenAlex)Listed in OpenAlex metadata; confirm current status in DOAJ
Works recorded in OpenAlex245
Citations recorded in OpenAlex962
OpenAlex H-index14
Years represented in OpenAlex2022–2026 (not the founding or closing dates)

Topics in published research

Sensor Technology and Measurement Systems; Non-Destructive Testing Techniques; Fault Detection and Control Systems; Electrical and Bioimpedance Tomography; Microwave and Dielectric Measurement Techniques; Machine Fault Diagnosis Techniques.

OpenAlex classifies topics from published works. These topics are not the publisher’s official aims and scope.

Source: OpenAlex source record. Retrieved 2026-10-03. Source record updated 2026-10-02. OpenAlex metrics are different from SCImago metrics and the Clarivate Journal Impact Factor.

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