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Academic Journal

Q3

Measurement Science Review

Sciendo

GermanyControl and Systems Engineering (Q3); Instrumentation (Q3); Biomedical Engineering (Q4)ISSN-matched source record
Submission information ↗
Q3Ranking
—Impact Factor (year unverified)
35H-index (SCImago 2025)
0.291SJR (2025)
2008-2026Coverage

About Measurement Science Review

Measurement Science Review is a scholarly journal published by Sciendo. SCImago 2025 lists it in Q3, with an SJR of 0.291 and H-index of 35.

Coverage: 2008-2026. Research categories: Control and Systems Engineering (Q3); Instrumentation (Q3); Biomedical Engineering (Q4).

Open-access policies and author information

Reported in the official DOAJ public CSV snapshot (2026-09-01), downloaded 2026-10-03. Record updated 2026-07-24. This snapshot does not establish today’s listing status or fee quotation.

Accepted manuscript languagesEnglish
Licence optionsCC BY-NC-ND
Peer-review processPeer review
APCDOAJ-reported APC: 300 EUR
Waiver policy reportedNo
Other fees reportedYes
Author retains unrestricted copyrightNo
Digital preservationPortico
Reported submission-to-publication time18 weeks on average; not a guarantee
Openly licensed content since2008 (not the journal founding year)

Publisher policy links recorded by DOAJ

Source: DOAJ journal record. Journal metadata is distributed by DOAJ under CC0. Confirm current fees, tax, eligibility and waiver terms with the publisher.

Source-backed journal facts

ISSN(s)1335-8871
ISSN-L1335-8871
Source typeJournal
Publisher / hosting organisationDe Gruyter Open
Publisher country codeSK
Fully open access (OpenAlex)Yes
DOAJ flag (OpenAlex)Listed in OpenAlex metadata; confirm current status in DOAJ
Works recorded in OpenAlex716
Citations recorded in OpenAlex7,548
OpenAlex H-index35
Years represented in OpenAlex2002–2026 (not the founding or closing dates)

Topics in published research

Scientific Measurement and Uncertainty Evaluation; Sensor Technology and Measurement Systems; Advanced Measurement and Metrology Techniques; Optical measurement and interference techniques; Advanced Sensor Technologies Research; Advanced Electrical Measurement Techniques.

OpenAlex classifies topics from published works. These topics are not the publisher’s official aims and scope.

Source: OpenAlex source record. Retrieved 2026-10-03. Source record updated 2026-10-02. OpenAlex metrics are different from SCImago metrics and the Clarivate Journal Impact Factor.

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