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X-Ray Imaging Spectrometer (XIS) on Board Suzaku

Katsuji Koyama, H. Tsunemi, Tadayasu Dotani, Mark W. Bautz, Kiyoshi Hayashida, Takeshi Go Tsuru, Hironori Matsumoto, Yoshiaki Ogawara, George R. Ricker, J. Doty, Steven E. Kissel, Rick Foster, Hiroshi Nakajima, Hiroya Yamaguchi, Hideyuki Mori, Masaaki Sakano, Kenji Hamaguchi, Mamiko Nishiuchi, Emi Miyata, Ken’ichi Torii, M. Namiki, Satoru Katsuda, Daisuke Matsuura, Tomofumi Miyauchi, Naohisa Anabuki, Noriaki Tawa, Masanobu Ozaki, Hiroshi Murakami, Yoshitomo Maeda, Yoshinori Ichikawa

📄 Abstract

The XIS is an X-ray Imaging Spectrometer system, consisting of state-of-the-art charge-coupled devices (CCDs) optimized for X-ray detection, camera bodies, and control electronics. Four sets of XIS sensors are placed at the focal planes of the grazing-incidence, nested thin-foil mirrors (XRT: X-Ray Telescope) onboard the Suzaku satellite. Three of the XIS sensors have front-illuminated CCDs, while the other has a back-illuminated CCD. Coupled with the XRT, the energy range of 0.2–12 keV with energy resolution of 130 eV at 5.9 keV, and a field of view of $18^prime times 18^prime$ are realized. Since the Suzaku launch on 2005 July 10, the XIS has been functioning well.

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